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It specifies the general characteristics of 200 and 300 mm notched SOI wafers
Certification
This Test Method covers the determination of total nitrogen concentration in the bulk of single crystal substrates using secondary ion mass spectrometry (SIMS)
SEMI M23-93 (first published)
PV01600 - SEMI PV16 - Specification for Nitric Acid Used in Photovoltaic Applications Revision:SEMI PV16-0316 - Current It specifies the general characteristicsThis Standard was technically approved by the Photovoltaic Materials Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on December 4, 2015. Available at www. semiviews. org and www. semi. org in March 2016; originally published June 2011. This Document standardizes requirements for nitric acid used in the photovoltaic (PV) industry and testing procedures to support those standards. Test